Micro-interferometer MII-4
Offer type: salePublished: 30.06.2015
| Seller: |  Evgenij Anatol'evich |
| Phones: |  098-717-3682 Show phone |
| Address: | Ukraine, Kyiv |
Contactless optical device designed to measure the roughness of the polished and finished surfaces, as well as for measuring film thicknesses (heights of ledges formed by the edge of the film and the substrate). An interference pattern can be observed in white and monochromatic light and photographed on film by the camera, which is part of the device. Microinterferometer allows you to make measurements using the ocular micrometer screw MOU or photoelectric ocular micrometer FOM with automatic processing of measurement results. The use of microinterferometer with photoelectric ocular micrometer allows to increase the accuracy of measurement of roughness parameters in 2 times, greatly reducing operator fatigue. Microinterferometer used in engineering industries and in laboratories of research institutes dealing with the quality of the surfaces
The range of measurement of roughness parameters Rmax and Rz and the film thickness: 0,1...0,8 µm
The increase in sightings, 500-fold.
Linear field of view in the object space of 0.3 mm.
Overall dimensions microinterferometer 300 x 300 x 420 mm
Weight 30 kg.
The range of measurement of roughness parameters Rmax and Rz and the film thickness: 0,1...0,8 µm
The increase in sightings, 500-fold.
Linear field of view in the object space of 0.3 mm.
Overall dimensions microinterferometer 300 x 300 x 420 mm
Weight 30 kg.
